19. Oktober 2023
Center for Soft Nanoscience
Europe/Berlin Zeitzone

Teilnahmewunsch

SEM Image Contest (MNF members only)

Offen 30.08.2023
Geschlossen 15.10.2023
Kontakt
rgupta@wwu.de, mnfday@wwu.de

Showcase your best shot from the ZEISS Microscopes

If you have a keen eye for detail and are passionate about producing stunning images using electron microscopes, this contest is tailor-made for you!

Contest details:

What makes a winning image?:

  • strong artistic compositions
  • detailed characteristics (brightness, contrast, focus)
  • technically sound with no charging effects, astigmatism, correct detector and acceleration voltage.
  • exciting image captions

Are there any limitations for participation?

  • The image must be from a Zeiss Microscope (XBeam 340, XBeam 1540 or Orion NanoFab)
  • One image accepted from each participant

**Deadline:** You may upload ONE image until **October 6th, 2023**.

The contest will be judged by Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions.

The winner will receive a super, spiffy ZEISS Terra ED 8x32!

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