Nanoanalytics Workshop

Dienstag 16.05.2023, 12:30 → 18:00 Europe/Berlin

100.004 (Center for Soft Nanoscience)

Maik Stappers

Join us at our upcoming MNF Nanoanalytics Workshop on Tuesday the 16th of May from 1-5pm in the Center for Soft Nanoscience (SoN).

During the workshop we will provide an overview of nanoanalytics tools and techniques at the MNF. Short introductory talks will cover the capabilities and limitations of each instrument, as well as basic principles of different measurement methods.

After the talks (and a coffee break) we will hold small-group discussions, allowing everyone to talk about concrete and potential measurements with experienced users of our machines. You will also have the opportunity to sign up for free in-person test measurements.

The following Tools and Techniques will be highlighted during the workshop:

Scanning Electron Microscopy (SEM) Zeiss Crossbeam 340 (SoN) Zeiss XB1540 (CeNTech) Jeol JSM-IT1000 (CeNTech) Laserscanning Microscopy Keyence VK-X3000 Scanning Ion Microscopy Zeiss Nanofab Orion (SoN)

Transmission Electron Microscopy (TEM) Thermo Fisher Scientific FEI TITAN Themis G3 60-300 Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS) Cryo-IONTOF M6 Special Edition Scanning Near-Field Optical Microscopy (SNOM) neaSNOM Atomic Force Microscopy (AFM) Bruker NanoScope Icon

We warmly invite you, your students and anyone at the university who may be interested! This will be a unique chance to learn more about our nanoanalytics capabilities and discuss possible analysis techniques in-person with our instrument managers.

There are limited spaces, so make sure to register soon.

data_protection_policy_MNF_workshops.pdf

MNF nanoanalytics workshop invitation.pdf

12:30 → 13:00 Arrival and sign in

13:00 → 13:10 Session I: Welcome & Introduction

Sitzungsleiter: Maik Stappers

13:10 → 13:30 Session I: Scanning Electron Microscope (SEM)

Vorsitzende der Sitzung: Johannes Kern, Mostafa Amirpour

13:30 → 13:40 Session I: Scanning Helium Ion Microscope (SHM)

Sitzungsleiter: Riya Gupta

13:40 → 13:50 Session I: Keyence Laserscanning Microscope

Sitzungsleiter: Stefan Ostendorp

13:50 → 14:10 Coffee Break

14:10 → 14:20 Session II:: Atomic Force Microscope (AFM)

Sitzungsleiter: Riya Gupta

14:20 → 14:35 Session II:: Scanning Near-Field Optical Microscope (SNOM)

Sitzungsleiter: Christian Gutheil

14:35 → 14:50 Session II:: Transmission Electron Microscope (TEM)

Sitzungsleiter: Harald Rösner

14:50 → 15:10 Session II:: Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS)

Sitzungsleiter: Bonnie June Tyler

15:15 → 17:15 Discussion tables

Meet individual instrument managers and ask them detailed questions about (among other things) what our instruments can do and how you can use them to create images for your publications or get information about the materials you have deposited. Bring your ideas and questions to the table!